Microelectronics Reliability Article Resources

This release contains resources referenced in the article accepted for publication in Microelectronics Reliability Journal: Bělohoubek, J.; Fišer, P.; Schmidt, J.: “Optically Induced Static Power in Combinational Logic: Vulnerabilities and Countermeasures”.

DDECS2020 paper resources

This release contains resources referenced in this paper: Bělohoubek, J.; Fišer, P.; Schmidt, J.: “Standard Cell Tuning Enables Data-Independent Static Power Consumption”. In: IEEE 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2020).

DDECS2019 paper experiments and models

This release contains resources referenced in this paper: Bělohoubek, J.; Fišer, P.; Schmidt, J.: Using Voters May Lead to Secret Leakage. In: 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2019)